发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
摘要 <p>PURPOSE:To suppress increasing of a chip area to the minimum and to perform relieving of good efficiency in a memory reading device having an error detection correcting circuit. CONSTITUTION:A defective address and a check bit 2 are previously stored by a fuse, when coincidence of external input addresses Axa-Axn and the stored defective address is detected by a defective address coincidence detecting circuit 1, the check bit 2 is selected by a word line WD1, data is corrected by an error detection correcting circuit 5 and outputted to an output circuit 6. When the external addresses do not coincide with the stored defective address, read out data is not passed through the error detection correcting circuit 5, and directly outputted to the output circuit 6. That is, increasing of a chip area can be suppressed and relieving of good efficiency can be performed by providing a check bit for only a defective address.</p>
申请公布号 JPH07130194(A) 申请公布日期 1995.05.19
申请号 JP19930278783 申请日期 1993.11.09
申请人 NEC KYUSHU LTD 发明人 HASHINAGA MASARU
分类号 G06F11/10;G11C17/14;G11C29/00;G11C29/42;(IPC1-7):G11C29/00 主分类号 G06F11/10
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