发明名称 HIGH-POTENTIAL DETECTION CIRCUIT
摘要 <p>PURPOSE:To obtain a high-potential detection circuit which can limit a stress voltage which is applied between a gate and a source of a MOS transistor of an inverter circuit for shaping waveform when detecting a high-potential input by an input-stage circuit and can prevent deterioration and damage of a gate insulation film. CONSTITUTION:An enhancement-type PMOS transistor PI and an enhancement- type NMOS transistor N1 where the source and the back gate are short-circuited are connected in series between an input node and a grounding potential node and are provided with an input stage circuit 12 where the drain of the NMOS transistor N1 becomes an output node and a waveform-shaping circuit 13 which is connected to the next stage of the input-starve circuit. Furthermore, a depletion-type MOS transistor ND which is inserted in series with a path between the input node of the input stage circuit and that of the waveform-shaping circuit and whose gate is connected to a power supply potential node is provided.</p>
申请公布号 JPH05288782(A) 申请公布日期 1993.11.02
申请号 JP19920094273 申请日期 1992.04.14
申请人 TOSHIBA CORP 发明人 BANBA HIRONORI;ATSUMI SHIGERU
分类号 G01R19/165;G11C16/06;G11C17/00;H03K19/003;(IPC1-7):G01R19/165 主分类号 G01R19/165
代理机构 代理人
主权项
地址