| 摘要 |
The probe card for automatic or manual testing of LOC type pad, analyzing chip circuit and arranging general pad, consists of: a silicon chip(5); a printed substrate(3) formed to cover a part of the silicon chip(5); a probe pin(12) positioned on the silicon chip(5) and fixed to the printed substrate(3); and an aligning means formed on the printed substrate(3). Pref. the probe pin(12) is positioned at side face of hole(3-11) being formed on the printed substrate(3), and exposing a part of the silicon chip(5).
|
