发明名称 Cap for semiconductor device package, and manufacturing method thereof
摘要 A cap for a semiconductor device package, including a body formed at a predetermined thickness with a cavity. The cap further includes a first seed layer formed on an inner circumference of a first via hole formed at a predetermined depth from the cavity formation surface of the body, a second seed layer formed on an inner circumference of a second via hole formed at a predetermined depth from the opposite surface to the cavity formation surface of the body, and plating materials filled in the first via hole and the second via hole.
申请公布号 US2006286798(A1) 申请公布日期 2006.12.21
申请号 US20060412900 申请日期 2006.04.28
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE MOON-CHUL;KWON JONG-OH;BACK KAE-DONG;WANG QIAN;HWANG JUN-SIK;JUNG KYU-DONG
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
主权项
地址