发明名称 |
Cap for semiconductor device package, and manufacturing method thereof |
摘要 |
A cap for a semiconductor device package, including a body formed at a predetermined thickness with a cavity. The cap further includes a first seed layer formed on an inner circumference of a first via hole formed at a predetermined depth from the cavity formation surface of the body, a second seed layer formed on an inner circumference of a second via hole formed at a predetermined depth from the opposite surface to the cavity formation surface of the body, and plating materials filled in the first via hole and the second via hole.
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申请公布号 |
US2006286798(A1) |
申请公布日期 |
2006.12.21 |
申请号 |
US20060412900 |
申请日期 |
2006.04.28 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE MOON-CHUL;KWON JONG-OH;BACK KAE-DONG;WANG QIAN;HWANG JUN-SIK;JUNG KYU-DONG |
分类号 |
H01L21/44 |
主分类号 |
H01L21/44 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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