发明名称 Method for manufacturing semiconductor device
摘要 After a bottom electrode film is formed, a ferroelectric film is formed on the bottom electrode film. Then, a heat treatment is performed for the ferroelectric film in an oxidizing atmosphere so as to crystallize the ferroelectric film. Then, a top electrode film is formed on the ferroelectric film. In the heat treatment (i.e., annealing for crystallization), a flow rate of oxidizing gas is set to be in a range of from 10 sccm to 100 sccm.
申请公布号 US7344898(B2) 申请公布日期 2008.03.18
申请号 US20050222871 申请日期 2005.09.12
申请人 FUJITSU LIMITED 发明人 WANG WENSHENG
分类号 H01L21/00;H01L21/338;H01L21/469 主分类号 H01L21/00
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