发明名称 FORMATION METHOD OF INSULATING FILM AND SEMICONDUCTOR DEVICE USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a formation method of an insulating film causing fluorine, HF, or low-molecular fluorocarbons to be eliminated less and having excellent adhesiveness with a film laminated on the insulating film in a manufacturing process of a semiconductor device, and to provide a semiconductor device formed by the formation method. SOLUTION: The formation method of an insulating film has: a process for forming a fluorocarbon film on a substrate; and a process for bringing the surface into contact with processed gas including inorganic fluorinating gas, such as SF<SB>6</SB>, NF<SB>3</SB>, SiF<SB>4</SB>, PF<SB>5</SB>, and BF<SB>3</SB>. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2008227307(A) 申请公布日期 2008.09.25
申请号 JP20070065759 申请日期 2007.03.14
申请人 NIPPON ZEON CO LTD 发明人 YUASA HIROKO;MATSUMOTO YUICHI;ITO AZUMI
分类号 H01L21/312;H01L21/768;H01L23/522 主分类号 H01L21/312
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