摘要 |
An apparatus for inspecting an image sensor and method for inspecting the same is provided to supply uniform light to the image device by using an optical fiber and diffusing the provided light to the first hole to supply the light to the imaging device. An image inspection device(100) comprises a first substrate(110), a second substrate(120), a connecting member(130), a contact assistant and an optical fiber(150). A first substrate comprises a first hole in which the light is transmitted and a first wring, formed at the neighboring of the first hole, transmitting the electric signal to the imaging device. A second substrate comprises a second hole in which the light is transmitted and a second wring, formed at the neighboring of the first hole, transmitting the electric signal to the imaging device. A connecting member is arranged between the first substrate and the second substrate and a first and the second wiring are electrically connected. An optical fiber is inserted into the second hole In order to uniformly provide the light which is incident in the first hole to the imaging device.
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