发明名称 |
TSV redundancy scheme and architecture using decoder/encoder |
摘要 |
A method of redirecting signal bits associated with or corresponding to defective TSVs of a TSV array to a row or a column of redundant TSVs in the TSV array using a 2:4 Decoder and 4:2 Encoder and the resulting device are provided. Embodiments include forming a TSV array between a bottom die and a top die of a 3D IC stack, the TSV array having a row and a column of redundant TSVs; identifying a defective TSV of the TSV array; determining whether to shift a signal bit associated with or corresponding to the defective TSV in a first and/or a second direction towards the row or the column of redundant TSVs; and shifting the signal bit in the first and/or the second direction until the signal bit has been redirected to the row or the column of redundant TSVs. |
申请公布号 |
US9401312(B1) |
申请公布日期 |
2016.07.26 |
申请号 |
US201514736769 |
申请日期 |
2015.06.11 |
申请人 |
GLOBALFOUNDRIES INC. |
发明人 |
Kannan Sukeshwar;Kannan Kaushal |
分类号 |
H01L21/768;H03K19/177;H03K19/173;H01L21/66 |
主分类号 |
H01L21/768 |
代理机构 |
Ditthavong & Steiner, P.C. |
代理人 |
Ditthavong & Steiner, P.C. |
主权项 |
1. A method comprising:
forming a through silicon via (TSV) array between a bottom die and a top die of a three-dimensional (3D) integrated circuit (IC) stack, the TSV array having a row and a column of redundant TSVs, wherein each TSV in the TSV array is connected to a 2:4 Decoder in the bottom die and a 4:2 Priority Encoder in the top die; identifying a defective TSV of the TSV array; determining whether to shift a signal bit associated with or corresponding to the defective TSV in a first and/or a second direction towards the row or the column of redundant TSVs; and shifting the signal bit in the first and/or the second direction until the signal bit has been redirected to the row or the column of redundant TSVs. |
地址 |
Grand Cayman KY |