发明名称 |
Metalized Elastomeric Probe Structure |
摘要 |
A probe structure for an electronic device is provided. In one aspect, the probe structure includes an electrically insulating carrier having one or more contact structures traversing a plane thereof. Each contact structure includes an elastomeric material having an electrically conductive layer running along at least one surface thereof continuously through the plane of the carrier. The probe structure includes one or more other contact structures adapted for connection to a test apparatus.
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申请公布号 |
US2008094085(A1) |
申请公布日期 |
2008.04.24 |
申请号 |
US20050718283 |
申请日期 |
2005.09.30 |
申请人 |
HOUGHAM GARETH G;AFZALI ALI;CORDES STEVEN A;COTEUS PAUL W;FARINELLI MATTHEW J;GOMA SHERIF A;LANZETTA ALPHONSO P;MORRIS DANIEL P;ROSNER JOANNA;YOHANNAN NISHA |
发明人 |
HOUGHAM GARETH G.;AFZALI ALI;CORDES STEVEN A.;COTEUS PAUL W.;FARINELLI MATTHEW J.;GOMA SHERIF A.;LANZETTA ALPHONSO P.;MORRIS DANIEL P.;ROSNER JOANNA;YOHANNAN NISHA |
分类号 |
G01R1/073;G01R31/26 |
主分类号 |
G01R1/073 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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