发明名称 Electrical chemical plating process
摘要 An electrical chemical plating process is provided. A semiconductor structure is provided in an electrical plating platform. A pre-electrical-plating step is performed wherein the pre-electrical-plating step is carried out under a fixed voltage environment and lasts for 0.2 to 0.5 seconds after the current is above the threshold current of the electrical plating platform. After the pre-electrical-plating step, a first electrical plating step is performed on the semiconductor structure.
申请公布号 US9416459(B2) 申请公布日期 2016.08.16
申请号 US201113154420 申请日期 2011.06.06
申请人 UNITED MICROELECTRONICS CORP. 发明人 Lin Chun-Ling;Lu Yen-Liang;Hsu Chi-Mao;Lin Chin-Fu;Chen Chun-Hung;Cheng Tsun-Min;Tsai Chi-Ray
分类号 C25D5/00;C25D7/12 主分类号 C25D5/00
代理机构 代理人 Hsu Winston;Margo Scott
主权项 1. An electrical chemical plating process, comprising: providing a semiconductor structure in an electro-plating machine; providing a pre-electro-plating step, wherein the pre-electro-plating step is performed under a fixed voltage condition and lasts for 0.2 to 0.5 seconds after the current exceeds a threshold current of the electro-plating machine and under a current which is gradually increased and stops at a maximum value, wherein the current in the pre-electro-plating step never exceeds the maximum value; and after the pre-electro-plating step, performing a first-electro-plating step.
地址 Hsin-Chu TW