发明名称 |
Electrical chemical plating process |
摘要 |
An electrical chemical plating process is provided. A semiconductor structure is provided in an electrical plating platform. A pre-electrical-plating step is performed wherein the pre-electrical-plating step is carried out under a fixed voltage environment and lasts for 0.2 to 0.5 seconds after the current is above the threshold current of the electrical plating platform. After the pre-electrical-plating step, a first electrical plating step is performed on the semiconductor structure. |
申请公布号 |
US9416459(B2) |
申请公布日期 |
2016.08.16 |
申请号 |
US201113154420 |
申请日期 |
2011.06.06 |
申请人 |
UNITED MICROELECTRONICS CORP. |
发明人 |
Lin Chun-Ling;Lu Yen-Liang;Hsu Chi-Mao;Lin Chin-Fu;Chen Chun-Hung;Cheng Tsun-Min;Tsai Chi-Ray |
分类号 |
C25D5/00;C25D7/12 |
主分类号 |
C25D5/00 |
代理机构 |
|
代理人 |
Hsu Winston;Margo Scott |
主权项 |
1. An electrical chemical plating process, comprising:
providing a semiconductor structure in an electro-plating machine; providing a pre-electro-plating step, wherein the pre-electro-plating step is performed under a fixed voltage condition and lasts for 0.2 to 0.5 seconds after the current exceeds a threshold current of the electro-plating machine and under a current which is gradually increased and stops at a maximum value, wherein the current in the pre-electro-plating step never exceeds the maximum value; and after the pre-electro-plating step, performing a first-electro-plating step. |
地址 |
Hsin-Chu TW |