Thickness gauging of single-layer conductive materials with two-point non linear calibration algorithm
摘要
A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.
申请公布号
US5847562(A)
申请公布日期
1998.12.08
申请号
US19970852990
申请日期
1997.05.08
申请人
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF THE NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
发明人
FULTON, JAMES P.;NAMKUNG, MIN;SIMPSON, JOHN W.;WINCHESKI, RUSSELL A.;NATH, SHRIDHAR C.