SCANNING ELEMENT AND APERTURE WAFER FOR ELECTRONIC PARTICLE COUNTING AND SIZING APPARATUS,申请号IL19700035566-传众专利搜索

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发明名称	SCANNING ELEMENT AND APERTURE WAFER FOR ELECTRONIC PARTICLE COUNTING AND SIZING APPARATUS
摘要
申请公布号	IL35566(A)	申请公布日期	1973.01.30
申请号	IL19700035566	申请日期	1970.11.02
申请人	COULTER W	发明人
分类号	G01N15/12;(IPC1-7):G01N15/02;G06M11/00	主分类号	G01N15/12
代理机构		代理人
主权项
地址

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