| 摘要 |
Disclosed is a test-cause generation method for implementing systematically the function test of logical devices. The method features the generation of partial test-causes for checking the functional relation at each state transition through the operations of entering a boolean function expressed in a decision table indicative of input-output correspondence, checking the constraint conditions for eliminating infeasible combinations between cause nodes, and expanding the decision table to produce all permissible partial test-causes. |
