Sample isolation in integrating analog-to-digital converters

摘要

To eliminate crosstalk between successive measurements of an integrating analog-to-digital converter having MOS linear amplifiers (16) that as a result of ion distribution shift in its input devices gate oxide (24) tends to retain a conversion residue (R), at least one "dummy" conversion cycle (38) is executed prior to each input signal measurement. The "dummy" conversion cycle (38) reduces the residue (R) by moving input gate ions into stable positions corresponding to the magnitude of the input signal to be next measured.