发明名称 Probe For Electric Test
摘要 A probe comprises a first and a second arm portions extending in the rightward and leftward direction at a vertical interval, a first and a second connecting portions connecting the first and second arm portions respectively at their front end portion and base end portion, and a needle point portion following one side in the upward and downward direction of the first connecting portion. At least one of the first and second arm portions has at least one of the whole arm portion, an edge portion on one side in the upward and downward direction of the arm portion, and an edge portion on the other side in the upward and downward direction of the arm portion made arcuate.
申请公布号 US2007216433(A1) 申请公布日期 2007.09.20
申请号 US20030556436 申请日期 2003.08.29
申请人 MIURA KIYOTOSHI;MIYAGI YUJI;AKAHIRA AKIHISA 发明人 MIURA KIYOTOSHI;MIYAGI YUJI;AKAHIRA AKIHISA
分类号 G01R31/00;G01R1/067;G01R31/26;H01L21/66 主分类号 G01R31/00
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