发明名称 METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE
摘要 In a method of manufacturing a semiconductor device, an insulating layer pattern defining at least one opening partially exposing a semiconductor substrate is formed on a semiconductor substrate including a single crystalline material. An amorphous thin layer is formed on the insulating layer pattern to fill up the opening. The amorphous thin layer is transformed into a single crystalline thin layer by providing the amorphous thin layer with a laser beam having sufficient energy to melt the amorphous thin layer. Here, the semiconductor substrate partially exposed through the opening is used as a seed. A gate pattern is formed on the single crystalline thin layer. Source/drain regions are formed at surface portions of the single crystalline thin layer adjacent to both sidewalls of the gate pattern.
申请公布号 US2008070372(A1) 申请公布日期 2008.03.20
申请号 US20070852901 申请日期 2007.09.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SON YONG-HOON;CHOI SI-YOUNG;LEE JONG-WOOK
分类号 H01L21/20;H01L21/336 主分类号 H01L21/20
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