发明名称 DRY ETCHING METHOD AND DEVICE USED FOR THE SAME
摘要 <p>An object is etched in an atmosphere in which the ratio of the number of oxygen atoms to that of carbon atoms is less than 10 while the deposition of a protective film and etching are controlled. Consequently, the side etching amount can be reduced at the time of forming wiring and finer wiring can be formed with higher dimensional accuracy even when the selection ratio to resist is raised.</p>
申请公布号 WO1998006128(P1) 申请公布日期 1998.02.12
申请号 JP1996003612 申请日期 1996.12.11
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址