发明名称 Lithographic apparatus, radiation system, contaminant trap, device manufacturing method, and method for trapping contaminants in a contaminant trap
摘要 A lithographic apparatus includes a radiation system that includes a source for producing a radiation beam, a contaminant trap arranged in a path of the radiation beam, and an illumination system configured to condition the radiation beam produced by the source, and a support for supporting a patterning device. The patterning device serves to impart the conditioned radiation beam with a pattern in its cross-section. The apparatus also includes a substrate table for holding a substrate, and a projection system for projecting the patterned radiation beam onto a target portion of the substrate. The contaminant trap includes a plurality of foils that define channels that are arranged substantially parallel to the direction of propagation of the radiation beam. The trap is provided with a gas supply system that is arranged to inject gas into at least one of the channels of the trap.
申请公布号 US7307263(B2) 申请公布日期 2007.12.11
申请号 US20040890404 申请日期 2004.07.14
申请人 ASML NETHERLANDS B.V. 发明人 BAKKER LEVINUS PIETER;BANINE VADIM YEVGENYEVICH;LUIJKX CORNELIS PETRUS ANDREAS MARIA;SCHUURMANS FRANK JEROEN PIETER
分类号 G03F7/20 主分类号 G03F7/20
代理机构 代理人
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