发明名称 Surface examining apparatus for detecting the presence of foreign particles on two or more surfaces
摘要 An apparatus usable with an object having surfaces, for examining the states of the surfaces, includes on irradiating system for irradiating the surfaces of the object with a single light beam, and a plurality of light-receiving systems provided in association with the surfaces of the object, respectively, the plural light-receiving systems being arranged to receive light scatteringly reflected from the surfaces of the object, respectively, and to produce outputs corresponding to the states of the surfaces of the object, respectively.
申请公布号 US4886975(A) 申请公布日期 1989.12.12
申请号 US19890348177 申请日期 1989.05.02
申请人 CANON KABUSHIKI KAISHA 发明人 MURAKAMI, EIICHI;KOHNO, MICHIO;SUZUKI, AKIYOSHI
分类号 G01N21/94;G01N21/956 主分类号 G01N21/94
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