发明名称 PLASMA CVD APPARATUS AND METHOD
摘要 <p>A plasma CVD apparatus and method by which a high quality thin film having an excellent uniformity of film thickness can be formed on a larger substrate. The plasma CVD apparatus comprises a linear or halfway-turned-down induction coupling electrode disposed in a reaction vessel, characterized in that: a high-frequency power supply section and a ground section are provided, respectively, at the opposite end parts of the induction coupling electrode; high frequency power is supplied such that a standing wave of half-wave length or integral multiples thereof is established between the power supply section and the ground section or between the power supply section and the ground section, and the turned down section; diameter of the induction coupling electrode is varied, or set at 10 mm or less at least partially between the power supply section and the ground section, or the electrode is coated with a dielectric.</p>
申请公布号 WO0188221(A1) 申请公布日期 2001.11.22
申请号 WO2001JP04113 申请日期 2001.05.17
申请人 ANELVA CORPORATION;TAKAGI, TOMOKO;UEDA, HITOSHI 发明人 TAKAGI, TOMOKO;UEDA, HITOSHI
分类号 C23C16/509;H01J37/32;(IPC1-7):C23C16/509;H01L31/04;H01L21/205 主分类号 C23C16/509
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