发明名称 |
Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives |
摘要 |
A method and apparatus for planarizing a microelectronic substrate. In one embodiment, the apparatus can include a fixed abrasive polishing pad having metal abrasive elements selected to be a compound of metal in the substrate. Alternatively, the metal abrasive elements can include a refractory metal where the substrate includes a refractory metal. Where the substrate includes two metals, the abrasive elements can be selected to planarize the first metal at a rate that is less than approximately twice the rate at which it planarizes the second metal. A single fixed abrasive polishing pad and a single planarizing liquid can be used to planarize both metals.
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申请公布号 |
US6331135(B1) |
申请公布日期 |
2001.12.18 |
申请号 |
US19990387067 |
申请日期 |
1999.08.31 |
申请人 |
MICRON TECHNOLOGY, INC. |
发明人 |
SABDE GUNDU M.;MEIKLE SCOTT |
分类号 |
B24B1/00;B24B21/00;B24B37/04;B24D11/00;B24D13/14;C09K3/14;H01L21/304;H01L21/321;H01L21/768;(IPC1-7):B24B5/00 |
主分类号 |
B24B1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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