发明名称 Method and apparatus for mechanical and chemical-mechanical planarization of microelectronic substrates with metal compound abrasives
摘要 A method and apparatus for planarizing a microelectronic substrate. In one embodiment, the apparatus can include a fixed abrasive polishing pad having metal abrasive elements selected to be a compound of metal in the substrate. Alternatively, the metal abrasive elements can include a refractory metal where the substrate includes a refractory metal. Where the substrate includes two metals, the abrasive elements can be selected to planarize the first metal at a rate that is less than approximately twice the rate at which it planarizes the second metal. A single fixed abrasive polishing pad and a single planarizing liquid can be used to planarize both metals.
申请公布号 US6331135(B1) 申请公布日期 2001.12.18
申请号 US19990387067 申请日期 1999.08.31
申请人 MICRON TECHNOLOGY, INC. 发明人 SABDE GUNDU M.;MEIKLE SCOTT
分类号 B24B1/00;B24B21/00;B24B37/04;B24D11/00;B24D13/14;C09K3/14;H01L21/304;H01L21/321;H01L21/768;(IPC1-7):B24B5/00 主分类号 B24B1/00
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