发明名称 INDICATION SYSTEM FOR OPTIMAL INSPECTION SEQUENCE
摘要 PURPOSE:To minimize the frequency or cost of inspection required up to the identification of a fault source by utilizing a fault wave and a network when a single fault occurs to an object under the influence of a fault, and indicating optimal inspection order on the basis of dynamic programming. CONSTITUTION:When a plant is in normal operation, pieces of information on an optimal inspecting equipment T'(Slk) classified by states are stored on a floppy disk FD102. When a fault occurs to the plant, this FD102 is inserted into the disk processor 103 of an optimal inspection order indicating device 101. Then, the contents of the FD102 are transferred to a memory part 105. An arithmetic part 104 utilizes information on the fault rate lambdai of the equipment in the memory part 105 to calculate relative fault probability qi, which is displayed at a display part 109. When an operator need not correct the qi, a current state vector S'lk is found by the arithmeticc device 104 and Slk which is the same as it is searched for in the memory part 105 to find a corresponding optimum equipment T'(S'lk) classified by states, which is displayed at the part 109. The operator inspects the indicated equipment and presses a normal or abnormal button.
申请公布号 JPS58217009(A) 申请公布日期 1983.12.16
申请号 JP19820099224 申请日期 1982.06.11
申请人 HITACHI SEISAKUSHO KK 发明人 SASAKI RIYOUICHI;SHINTANI SADANORI;FURUKAWA MASAZUMI
分类号 G21C17/00;G05B23/02 主分类号 G21C17/00
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