发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To produce highly reliable semiconductor device by providing a transistor using an oxide semiconductor film for a channel with stable electric characteristics.SOLUTION: The semiconductor device is manufactured by laminating and forming an oxide semiconductor film that may be a first crystal structure by a heating treatment and an oxide semiconductor film that may be a second crystal structure by a heating treatment, and by applying a heating treatment, the oxide semiconductor film having the second crystal structure as a seed grows into the oxide semiconductor film having the first crystal structure. The oxide semiconductor film formed in such a manner is used for an active layer of a transistor.SELECTED DRAWING: Figure 13
申请公布号 JP2016105494(A) 申请公布日期 2016.06.09
申请号 JP20160001041 申请日期 2016.01.06
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TAKAHASHI MASAHIRO;MARUYAMA YOSHIKI
分类号 H01L29/786;G02F1/1368;H01L21/20;H01L51/50 主分类号 H01L29/786
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