发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To produce highly reliable semiconductor device by providing a transistor using an oxide semiconductor film for a channel with stable electric characteristics.SOLUTION: The semiconductor device is manufactured by laminating and forming an oxide semiconductor film that may be a first crystal structure by a heating treatment and an oxide semiconductor film that may be a second crystal structure by a heating treatment, and by applying a heating treatment, the oxide semiconductor film having the second crystal structure as a seed grows into the oxide semiconductor film having the first crystal structure. The oxide semiconductor film formed in such a manner is used for an active layer of a transistor.SELECTED DRAWING: Figure 13 |
申请公布号 |
JP2016105494(A) |
申请公布日期 |
2016.06.09 |
申请号 |
JP20160001041 |
申请日期 |
2016.01.06 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
YAMAZAKI SHUNPEI;TAKAHASHI MASAHIRO;MARUYAMA YOSHIKI |
分类号 |
H01L29/786;G02F1/1368;H01L21/20;H01L51/50 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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