ROBUST GROUP III NITRIDE LIGHT EMITTING DIODE FOR HIGH RELIABILITY IN STANDARD APPLICATIONS

摘要

A physically robust light emitting diode is disclosed that offers high-reliability in standard packaging and that will withstand high temperature and high humidity conditions. The diode comprises a Group III nitride heterojunction diode with a p-type Group III nitride contact layer, and ohmic contact to the p-type contact layer, and a passivation layer on the ohmic contact. The diode is characterized in that it will emit at least 50 % of its original optical power and remain substantially unchanged in operating voltage after operating for at least 1000 hours at 10 milliamps in an environment of 85 % relative humidity at a temperature of 85 DEG C. An LED lamp incorporating the diode is also disclosed.