| 摘要 |
A new type of x-ray fluorescence detector is disclosed that utilizes the measured intensities of fluorescent L alpha and L beta x-rays, or K alpha and K beta x-rays of a target element, to determine the absolute concentration of the target element, independent of either the thickness or the nature of covering layers over the target element. The detector uses a source of initiating photons whose energy is in a specific range, a detector of the characteristic lead L or K x-rays with sufficient energy resolution to measure the intensities of the L alpha and L beta rays separately, or K alpha and K beta x-ray separately, a signal processor, and an appropriate read-out. The detector will improve the rapidity and accuracy of measurements, especially that of lead in paint and in bone, in a very cost-effective manner.
|
