发明名称 RESIST PATTERN FORMING METHOD BY HEAT LITHOGRAPHY
摘要 <P>PROBLEM TO BE SOLVED: To provide a resist pattern forming method by heat lithography, by which a resist pattern of excellent profile can be formed. <P>SOLUTION: The resist pattern forming method by heat lithography includes: a step of forming a resist film on a support using a resist composition; a step of selectively exposing "the resist film" or "a resist underlayer film on the support located near the resist film", both absorbing light of a wavelength of an exposing source used in the heat lithography, under the following conditions (1), (2) and (3); and a step of developing the resist film to form a resist pattern. (1) The exposure method: a DC line system, (2) laser drawing linear velocity: 0.5-6.0 m/s, and (3) laser power: 0.1-40 mW. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008310026(A) 申请公布日期 2008.12.25
申请号 JP20070157598 申请日期 2007.06.14
申请人 TOKYO OHKA KOGYO CO LTD 发明人 FURUYA SANAE;HANEDA HIDEO
分类号 G03F7/095;G03F7/004;G03F7/20;H01L21/027 主分类号 G03F7/095
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