Reflectometry test system using a sliding pseudo-noise reference

摘要

A technique for reflectometry testing of a signal path is disclosed. The technique includes injecting a test signal based on a probe pseudo-noise sequence into the signal path and obtaining a response signal. A sliding reference pseudo-noise sequence is correlated against the response signal. Both the probe sequence and the reference sequence are generated at a chip rate. The correlation is obtained for integer chip time delays, and sub-chip resolution of a peak correlation delay is estimated from at least two samples of the correlation.