发明名称 THIN FILM FORMING APPARATUS CLEANING METHOD
摘要 A thermal treatment apparatus cleaning method includes a heating step to heat a reaction chamber up to 300 °C and a cleaning step to remove silicon nitride from an inner portion of the thermal treatment apparatus. In the cleaning step, a reaction tube heated up to 300°C is filled with a cleaning gas containing fluorine gas, chlorine gas, and nitrogen gas and silicon nitride is removed, thereby cleaning the inner portion of the thermal treatment apparatus.
申请公布号 KR20070117005(A) 申请公布日期 2007.12.11
申请号 KR20077027864 申请日期 2007.11.29
申请人 TOKYO ELECTRON LIMITED 发明人 NISHIMURA KAZUAKI;TOJO YUKIO;SPAULL PHILLIP;TAGO KENJI
分类号 H01L21/20;C23C16/44;H01L21/302;H01L21/3065;H01L21/31 主分类号 H01L21/20
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