发明名称 DAMAGE-FREE SCULPTURED COATING DEPOSITION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a method for sputtering and depositing a carrier/barrier layer substantially without contaminating or disturbing the surrounding surface and subjecting the carrier/barrier layer to sculptured coating to achieve a desired shape. <P>SOLUTION: In the method, a sculptured material layer is applied onto a semiconductor feature surface using ion deposition sputtering, wherein a surface onto which the sculptured layer is applied is protected to resist erosion and contamination by collision of ions of a deposited layer. The method comprises a step of applying a first portion of a sculptured layer with a substrate bias sufficiently low for preventing erosion or contamination of the surface onto which the sculptured layer is applied and a step of applying a subsequent portion of the sculptured layer with a substrate bias sufficiently high for sculpturing a shape from the first portion while depositing an additional layer material. The method is particularly applicable to the sculpturing of a barrier layer, a wetting layer, a conductive layer, etc. on a semiconductor feature surface and is especially helpful when the conductive layer is copper. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2008308765(A) 申请公布日期 2008.12.25
申请号 JP20080183140 申请日期 2008.07.14
申请人 APPLIED MATERIALS INC 发明人 CHIANG TONY;YAO GONGDA;DING PEIJUN;CHEN FUSEN;CHIN BARRY;KOHARA GENE;XU ZHENG;ZHANG HONG
分类号 C23C14/34;H01L21/285;H01L21/28;H01L21/768 主分类号 C23C14/34
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