发明名称 METHOD OF FORMING CAPACITORS IN A SEMICONDUCTOR DEVICE
摘要 A method of forming capacitors in a semiconductor device, involves providing a first insulating layer, providing a first mask with an array of apertures over the insulating layer, and etching an array of holes in the first insulating layer through said apertures in said first mask. A first electrode layer extending into the holes is formed over the first insulating layer. A second dielectric layer extends into the holes on said first electrode layer. A second electrode layer extends into the holes on the dielectric layer. The capacitors are patterned with a second mask. The capacitors can be subsequently connected into the circuit in a sequence of processing steps that only involve the addition two extra masks beyond those conventionally employed in integrated circuit manufacture.
申请公布号 CA2272170(A1) 申请公布日期 1999.11.20
申请号 CA19992272170 申请日期 1999.05.18
申请人 MITEL CORPORATION 发明人 OUELLET, LUC;BLAIN, STEPHANE
分类号 H01L27/04;H01L21/02;H01L21/822;H01L27/06;(IPC1-7):H01G13/00 主分类号 H01L27/04
代理机构 代理人
主权项
地址