发明名称 |
METHOD OF FORMING CAPACITORS IN A SEMICONDUCTOR DEVICE |
摘要 |
A method of forming capacitors in a semiconductor device, involves providing a first insulating layer, providing a first mask with an array of apertures over the insulating layer, and etching an array of holes in the first insulating layer through said apertures in said first mask. A first electrode layer extending into the holes is formed over the first insulating layer. A second dielectric layer extends into the holes on said first electrode layer. A second electrode layer extends into the holes on the dielectric layer. The capacitors are patterned with a second mask. The capacitors can be subsequently connected into the circuit in a sequence of processing steps that only involve the addition two extra masks beyond those conventionally employed in integrated circuit manufacture.
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申请公布号 |
CA2272170(A1) |
申请公布日期 |
1999.11.20 |
申请号 |
CA19992272170 |
申请日期 |
1999.05.18 |
申请人 |
MITEL CORPORATION |
发明人 |
OUELLET, LUC;BLAIN, STEPHANE |
分类号 |
H01L27/04;H01L21/02;H01L21/822;H01L27/06;(IPC1-7):H01G13/00 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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