发明名称 APPARATUS FOR MEASURING TEMPERATURE OF POWER DEVICE USING PIEZOELECTRIC DEVICE
摘要 According to an embodiment of the present invention, an apparatus to measure a temperature of a power device using a piezoelectric device comprises: a substrate; one or more power devices formed on one surface of the substrate; and one or more piezoelectric devices arranged on the substrate to be separated from the power devices, measuring the thermal stress generated in the substrate to sense a temperature when the power devices are heated.
申请公布号 KR101656378(B1) 申请公布日期 2016.09.09
申请号 KR20150066819 申请日期 2015.05.13
申请人 IUCF-HYU (INDUSTRY-UNIVERSITY COOPERATION FOUNDATION HANYANG UNIVERSITY) 发明人 YOON, SANG WON;KIM, MIN KI
分类号 G01K5/56;G01B7/16;G01K13/00;H01L41/08;H02N2/18 主分类号 G01K5/56
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