发明名称 Apparatus and method for programmable trip settings in a faulted circuit indicator
摘要 A fault indicator for indicating the occurrence of a fault in an electrical conductor is programmable, such as in the field, by placing a magnet in proximity to the housing of the fault indicator. A data processor senses the changed state of a magnetic switch and, after a predetermined delay, initiates a programming routine to enable selection of one of a plurality of trip settings for the fault indicator. During programming, display LEDs flash once for programming of the first trip setting, twice for setting of the second trip setting, and so forth. Removal of the magnet from proximity to the fault indicator while at the desired trip setting will result in programming of the fault indicator to that trip setting.
申请公布号 US7271580(B1) 申请公布日期 2007.09.18
申请号 US20040988007 申请日期 2004.11.12
申请人 SCHWEITZER ENGINEERING LABORATORIES, INC. 发明人 FENSKE KURT J.;FEIGHT LAURENCE V.
分类号 G01R31/00 主分类号 G01R31/00
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