| 摘要 |
The invention relates to a method for inspecting a sample with an assembly comprising a scanning electron microscope (SEM) and a light microscope (LM). The assembly comprises a sample holder for holding the sample. The sample holder is arranged for inspecting the sample with both the SEM and the LM, preferably at the same time. The method comprising the steps of: determining values to which the SEM parameters need to be set to image the sample at a desired resolution; capturing a LM image of the sample in its position for imaging with the SEM; determining a position and dimensions of a region of interest in or on the sample using the LM image; and capturing a SEM image of the region of interest, preferably using the first electron beam exposure of said region of interest. |
