发明名称 Body-tied, strained-channel multi-gate device and methods of manufacturing same
摘要 A fin-FET or other multi-gate transistor is disclosed. The transistor comprises a semiconductor substrate having a first lattice constant, and a semiconductor fin extending from the semiconductor substrate. The fin has a second lattice constant, different from the first lattice constant, and a top surface and two opposed side surfaces. The transistor also includes a gate dielectric covering at least a portion of the top surface and the two opposed side surfaces, and a gate electrode covering at least a portion of the gate dielectric. The resulting channel has a strain induced therein by the lattice mismatch between the fin and the substrate. This strain can be tuned by selection of the respective materials.
申请公布号 US9406800(B2) 申请公布日期 2016.08.02
申请号 US201514969914 申请日期 2015.12.15
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Lin Hong-Nien;Lin Horng-Chih;Huang Tiao-Yuan
分类号 H01L21/336;H01L29/78;H01L21/8238;H01L29/16;H01L29/161;H01L29/165;H01L29/66 主分类号 H01L21/336
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A method comprising: epitaxially growing on a substrate having a first lattice constant, a fin having a second lattice constant, different than the first lattice constant; and epitaxially growing a cap layer on the fin, the cap layer having the first lattice constant.
地址 Hsin-Chu TW