发明名称 |
Body-tied, strained-channel multi-gate device and methods of manufacturing same |
摘要 |
A fin-FET or other multi-gate transistor is disclosed. The transistor comprises a semiconductor substrate having a first lattice constant, and a semiconductor fin extending from the semiconductor substrate. The fin has a second lattice constant, different from the first lattice constant, and a top surface and two opposed side surfaces. The transistor also includes a gate dielectric covering at least a portion of the top surface and the two opposed side surfaces, and a gate electrode covering at least a portion of the gate dielectric. The resulting channel has a strain induced therein by the lattice mismatch between the fin and the substrate. This strain can be tuned by selection of the respective materials. |
申请公布号 |
US9406800(B2) |
申请公布日期 |
2016.08.02 |
申请号 |
US201514969914 |
申请日期 |
2015.12.15 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Lin Hong-Nien;Lin Horng-Chih;Huang Tiao-Yuan |
分类号 |
H01L21/336;H01L29/78;H01L21/8238;H01L29/16;H01L29/161;H01L29/165;H01L29/66 |
主分类号 |
H01L21/336 |
代理机构 |
Slater Matsil, LLP |
代理人 |
Slater Matsil, LLP |
主权项 |
1. A method comprising:
epitaxially growing on a substrate having a first lattice constant, a fin having a second lattice constant, different than the first lattice constant; and epitaxially growing a cap layer on the fin, the cap layer having the first lattice constant. |
地址 |
Hsin-Chu TW |