发明名称 FORMATION OF DIELECTRIC THIN FILM PATTERN AND LAMINATE PATTERN
摘要 PROBLEM TO BE SOLVED: To form a low loss dielectric thin film by normal temperature deposition and lift-off method. SOLUTION: After a specified resist pattern 2 is formed on a substrate 1, a conductor (Cu) thin film 4 is deposited under normal temperature on a substrate 1 from above a resist pattern 2 at a substrate temperature of 150 deg.C or below followed by normal temperature deposition of a dielectric thin film 5 of any one of CeO2, Sm2O3, Dy2O3, Y2O3, TiO2, Al2O3 or MgO on the underlying conductor thin film 4 at the substrate temperature of 150 deg.C or below. A conductor (Cu) thin film 6 is further deposited on the dielectric thin film 5 under normal temperature at the substrate temperature of 150 deg.C or below and then the conductor thin films 4, 6 and the dielectric thin film 5 are stripped along with the resist pattern 2 to form a wiring pattern 7 lift-off method.
申请公布号 JP2000164575(A) 申请公布日期 2000.06.16
申请号 JP19980337868 申请日期 1998.11.27
申请人 MURATA MFG CO LTD 发明人 KOSHIDO YOSHIHIRO;FUJIBAYASHI KATSURA;TOYODA YUJI;OKAWA TADAYUKI;TAKAHASHI RYOICHIRO
分类号 H05K3/46;H01L21/02;H01L21/027;H01L21/302;H01L21/3065;H01L21/316;H01P3/16;H05K1/02;H05K3/04 主分类号 H05K3/46
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