Test method for an integrated circuit including non-volatile memory cell capable of temporarily holding information.

摘要

There are provided, in addition to an ordinary operation word line (10) for controlling a non-volatile memory upon regularly writing or reading information, an inspection word line (22), a selection transistor (24, 34), and a storage capacitor (26, 36), whereby a signal is inputted onto the inspection word line upon inspection to switch on the selection transistor and hence the information is inputted into the capacitor through a bit line (12) for writing into and reading from the capacitor. More specifically, the selection transistor and the capacitor are operatd as in a DRAM to diagnose the function of an integrated circuit chip without operation of the non-volatile memory.