CALIBRATION OF MAGNETIC FORCE OR SCANNING HALL PROBE MICROSCOPE

摘要

PROBLEM TO BE SOLVED: To achieve simple and accurate calibration for MEM and SHPM by calculating an instrument response function from a rough image S and approximate sample stray magnetic field distribution H0 of a magnetic force microscope (MEM) or scanning Hall probe microscope(SHPM). SOLUTION: A sample with an irregular sample magnetization pattern M over an expanded region is given. An approximate sample magnetization pattern M0 is determined from the rough MEM or SHPM image S of a sample, thus determining an approximate sample stray magnetic field distribution H0. An instrument response function IRF is calculated from the rough MEM or SHPM image S and the approximate stray magnetic field distribution H0. Then, the instrument response function IRF is applied to correct an arbitrary rough MEM or SHPM image for functioning as a general calibration function for the MEM or SHPM.