发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To enable in a short time and easy the formation of a shallow P-type semiconductor region, having relatively high impurity concentration and a deep P-type semiconductor region having relatively low impurity concentration. SOLUTION: In this manufacturing method, a liquid impurity material source 2 composed of mixed material of aluminum, boron and organic solvent is spread on the surface of an N-type semiconductor substrate 1 and heated at a temperature lower than the diffusion temperature of aluminum, the organic solvent is vaporized, and a layer containing aluminum and boron is formed. The layer is thermally treated in an atmosphere containing oxygen. After that, thermal treatment is performed at a temperature higher than that of this thermal treatment, aluminum and boron are diffused in the N-type semiconductor substrate 1, and first and second P-type semiconductor regions 7, 8 different respectively in impurity concentrations are formed.
申请公布号 JP2000286205(A) 申请公布日期 2000.10.13
申请号 JP19990086998 申请日期 1999.03.29
申请人 SANKEN ELECTRIC CO LTD 发明人 SUGIYAMA KINJI;TANAKA YASUO;YAJIMA HIROSHI
分类号 H01L21/225;(IPC1-7):H01L21/225 主分类号 H01L21/225
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