| 摘要 |
The method involves providing a test element e.g. tape-like test element (112), partially with error marking, which contains information of defectiveness of the test elements comprising radiation material. The test elements are charged with a radiation (156), which is arranged to cause a marking in the form of an optically detectable change e.g. florescence change, in the radiation material. A light source (144) e.g. LED, is used for producing the radiation, which comprises an ultraviolet radiation at a wavelength range of 350 nanometers to 380 nanometers. Independent claims are also included for the following: (1) a method for manufacturing a test element (2) a device for manufacturing a test element comprising a test element marking device (3) an analytical testing device for detection of analytes in a sample, comprising a sampling device. |
