发明名称 SAMPLE TESTING PACKAGE
摘要 PROBLEM TO BE SOLVED: To provide a sample testing package which is free from restrictions in performing tests and enables rapid testing even when a sample precipitates easily in a sample solution.SOLUTION: A sample testing package includes: a sensor chip 2 having a fixing space 6 provided on a front face thereof for a reactant that selectively reacts with a sample contained in a sample solution 4; a substrate 3 having a rear face of the sensor chip 2 secured thereon; leads 8 for external connection electrically connected to the sensor chip 2 via wires 7; an insulator 9 that is provided on the substrate 3 to insulate the wires 7 from outside; and a surrounding wall 10 formed like a series of rings surrounding the fixing space 6.SELECTED DRAWING: Figure 2
申请公布号 JP2016145740(A) 申请公布日期 2016.08.12
申请号 JP20150022500 申请日期 2015.02.06
申请人 AISIN SEIKI CO LTD;MAG ARRAY INC;IMRA AMERICA INC 发明人 TOYOMARU KOJI
分类号 G01N33/483;G01N33/543 主分类号 G01N33/483
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