发明名称 Reconstruction of samples using learning process
摘要 The complete reconstruction is based upon 15 samples of random values that have two characteristic parameters (A, B) that can be represented on a two dimensional plot. The characteristics can be freely selected and are assigned values within a defined range. For each process the characteristic value are selected to obtain an optimum reconstruction.
申请公布号 DE19808666(A1) 申请公布日期 1998.09.10
申请号 DE19981008666 申请日期 1998.03.02
申请人 DELPHI SYSTEMSIMULATION GMBH, 80331 MUENCHEN, DE 发明人 SCHMIDT, GUENTER, DR., 82008 UNTERHACHING, DE
分类号 G06K9/62;(IPC1-7):G06F15/18;G06T5/00;G10L5/00 主分类号 G06K9/62
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