发明名称 |
Reconstruction of samples using learning process |
摘要 |
The complete reconstruction is based upon 15 samples of random values that have two characteristic parameters (A, B) that can be represented on a two dimensional plot. The characteristics can be freely selected and are assigned values within a defined range. For each process the characteristic value are selected to obtain an optimum reconstruction.
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申请公布号 |
DE19808666(A1) |
申请公布日期 |
1998.09.10 |
申请号 |
DE19981008666 |
申请日期 |
1998.03.02 |
申请人 |
DELPHI SYSTEMSIMULATION GMBH, 80331 MUENCHEN, DE |
发明人 |
SCHMIDT, GUENTER, DR., 82008 UNTERHACHING, DE |
分类号 |
G06K9/62;(IPC1-7):G06F15/18;G06T5/00;G10L5/00 |
主分类号 |
G06K9/62 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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