发明名称 PARTICLE BEAM DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a particle beam device suitable for observing, analyzing, working, etc., of insulators. SOLUTION: A sample 2 is placed on a conductor plate 12 of a sample stage which comprises the conductor plate 12, a thick insulator member 13, and a conductor plate 14, with the insulator member 13 sandwiched between the conductor plates 12 and 14. The conductor plate 14, being grounded, a negative input terminal of an operational amplifier 15 is connected to the conductor plate 12 while a positive input terminal is connected to the conductor plate 14. A control device 16 is provided which controls a filament heating power source FS of a neutralizing electron gun 4. The control device turns the filament heating power source FS on/off, controls an output voltage of the filament heating power source FS based on the signal from the operational amplifier 15, and controls a deflection power source RS.
申请公布号 JP2002260568(A) 申请公布日期 2002.09.13
申请号 JP20010059398 申请日期 2001.03.05
申请人 JEOL LTD 发明人 ARIMITSU MASAHIRO
分类号 H01J37/20;(IPC1-7):H01J37/20 主分类号 H01J37/20
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