发明名称 |
Thin film transistor array panel |
摘要 |
A thin-film transistor array panel includes an insulation substrate, a gate line disposed on the insulation substrate, a gate insulating layer disposed on the gate line, a semiconductor layer disposed on the gate insulating layer, a data line disposed on the semiconductor layer and including a source electrode, a drain electrode disposed on the semiconductor layer and facing the source electrode, a first electrode disposed on the gate insulating layer, a first passivation layer disposed on the first electrode and including silicon nitride, a second passivation layer disposed on the first passivation and including silicon nitride, and a second electrode disposed on the passivation layer, in which a first ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the first passivation layer is different from a second ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the second passivation layer. |
申请公布号 |
US9406704(B1) |
申请公布日期 |
2016.08.02 |
申请号 |
US201514799995 |
申请日期 |
2015.07.15 |
申请人 |
Samsung Display Co., Ltd. |
发明人 |
Chung Yung Bin;Baek Chul-Hyun;Cho Eun Jeong;Jo Jung Yun |
分类号 |
H01L27/14;H01L27/12;H01L29/66;H01L29/786;H01L29/417;H01L21/02 |
主分类号 |
H01L27/14 |
代理机构 |
H.C. Park & Associates, PLC |
代理人 |
H.C. Park & Associates, PLC |
主权项 |
1. A thin-film transistor array panel, comprising:
an insulation substrate; a gate line disposed on the insulation substrate; a gate insulating layer disposed on the gate line; a semiconductor layer disposed on the gate insulating layer; a data line disposed on the semiconductor layer and comprising a source electrode; a drain electrode disposed on the semiconductor layer and facing the source electrode; a first electrode disposed on the gate insulating layer; a first passivation layer disposed on the first electrode and comprising silicon nitride; a second passivation layer disposed on the first passivation and comprising silicon nitride; and a second electrode disposed on the passivation layer, wherein a first ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the first passivation layer is different from a second ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the second passivation layer. |
地址 |
Yongin-si KR |