发明名称 Thin film transistor array panel
摘要 A thin-film transistor array panel includes an insulation substrate, a gate line disposed on the insulation substrate, a gate insulating layer disposed on the gate line, a semiconductor layer disposed on the gate insulating layer, a data line disposed on the semiconductor layer and including a source electrode, a drain electrode disposed on the semiconductor layer and facing the source electrode, a first electrode disposed on the gate insulating layer, a first passivation layer disposed on the first electrode and including silicon nitride, a second passivation layer disposed on the first passivation and including silicon nitride, and a second electrode disposed on the passivation layer, in which a first ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the first passivation layer is different from a second ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the second passivation layer.
申请公布号 US9406704(B1) 申请公布日期 2016.08.02
申请号 US201514799995 申请日期 2015.07.15
申请人 Samsung Display Co., Ltd. 发明人 Chung Yung Bin;Baek Chul-Hyun;Cho Eun Jeong;Jo Jung Yun
分类号 H01L27/14;H01L27/12;H01L29/66;H01L29/786;H01L29/417;H01L21/02 主分类号 H01L27/14
代理机构 H.C. Park & Associates, PLC 代理人 H.C. Park & Associates, PLC
主权项 1. A thin-film transistor array panel, comprising: an insulation substrate; a gate line disposed on the insulation substrate; a gate insulating layer disposed on the gate line; a semiconductor layer disposed on the gate insulating layer; a data line disposed on the semiconductor layer and comprising a source electrode; a drain electrode disposed on the semiconductor layer and facing the source electrode; a first electrode disposed on the gate insulating layer; a first passivation layer disposed on the first electrode and comprising silicon nitride; a second passivation layer disposed on the first passivation and comprising silicon nitride; and a second electrode disposed on the passivation layer, wherein a first ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the first passivation layer is different from a second ratio of nitrogen-hydrogen bonds to silicon-hydrogen bonds in the second passivation layer.
地址 Yongin-si KR