| 摘要 |
PROBLEM TO BE SOLVED: To enable rapid check of a defect without using a master image. SOLUTION: The defect-checking device obtains a mean luminance value of an image of a size decided based on a repeating pattern or an exposure shot size for a photographs image, and checks the detect based on the mean luminance value and previously decided inspection conditions. In a first defect check, the photographed image is converted in size, and the image is averaged in a prescribed size, and the defect is checked. In a second defect check, a mean shot image obtained by summing averaging the image at each shot is formed, four corners of the mean shot image are sliced into a prescribed size, and the defect is checked according to the mean luminance value of the diagonal positions. In a third defect check, the mean shot image is averaged in a prescribed size, the standard deviation of the luminance is calculated and the defect is checked.
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