发明名称 PROCESS FOR DRY LITHOGRAPHY ETCHING
摘要 <p>PROBLEM TO BE SOLVED: To etch an exposed portion of a material layer and carry out accurate pattern transfer by a method, wherein anisotropic etching is performed with vapor mixture of oxygen, chlorine and nitrogen and the vapor mixture contains nitrogen of volume percentage of a specific value. SOLUTION: An exposed portion of a metallic layer 11 is etched to form a metallic layer 41 which is pattern-formed. Specifically, an anisotropic RIE process is carried out using a vapor mixture containing oxygen, chlorine and nitrogen. The oxygen and chlorine mixture is combined with nitrogen, so that an etchant vapor mixture becomes in a range of about 0.1 volume percent to about 70 volume percents. The sizes of an undercut caused during the etching are controlled to a certain degree by an amount of nitrogen in the etchant.</p>
申请公布号 JPH08330288(A) 申请公布日期 1996.12.13
申请号 JP19960129400 申请日期 1996.05.24
申请人 AT & T CORP 发明人 ABUINOOMU KOONBURITSUTO;ANSONII EDOWAADO NOOBUENBAA
分类号 H01L21/302;C23F4/00;G03F1/22;G03F1/80;H01L21/027;H01L21/3065;H01L21/3213;(IPC1-7):H01L21/306 主分类号 H01L21/302
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