发明名称 |
MEMORY CELL PROVIDED WITH PROGRAM/MARGIN VERIFICATION |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a programmable non-volatile memory cell provided with programming voltage margin verification. SOLUTION: A memory cell comprises a voltage comparator 12 having a differential input having a first input 14 and a second input 16, and a bias circuit 26 generating differential input voltage. Voltage offset 18 is applied to a second input of the comparator to supply input offset voltage. Programming voltage (HYDRAIN) for programming a memory cell is received by a programming input, and the memory cell supplies an output signal Q. A current made to flow in an output and a programming input is monitored to verify voltage margin in a state in which the memory cell is not programmed or in a appropriately programmed state.</p> |
申请公布号 |
JPH11203898(A) |
申请公布日期 |
1999.07.30 |
申请号 |
JP19980297673 |
申请日期 |
1998.10.20 |
申请人 |
DELCO ELECTRON CORP |
发明人 |
REED ROBERT HARRISON;KOGLIN DENNIS MICHAEL;KEARNEY MARK BILLINGS |
分类号 |
G11C17/00;G11C16/34;G11C29/50;(IPC1-7):G11C29/00 |
主分类号 |
G11C17/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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