发明名称 MEMORY CELL PROVIDED WITH PROGRAM/MARGIN VERIFICATION
摘要 <p>PROBLEM TO BE SOLVED: To provide a programmable non-volatile memory cell provided with programming voltage margin verification. SOLUTION: A memory cell comprises a voltage comparator 12 having a differential input having a first input 14 and a second input 16, and a bias circuit 26 generating differential input voltage. Voltage offset 18 is applied to a second input of the comparator to supply input offset voltage. Programming voltage (HYDRAIN) for programming a memory cell is received by a programming input, and the memory cell supplies an output signal Q. A current made to flow in an output and a programming input is monitored to verify voltage margin in a state in which the memory cell is not programmed or in a appropriately programmed state.</p>
申请公布号 JPH11203898(A) 申请公布日期 1999.07.30
申请号 JP19980297673 申请日期 1998.10.20
申请人 DELCO ELECTRON CORP 发明人 REED ROBERT HARRISON;KOGLIN DENNIS MICHAEL;KEARNEY MARK BILLINGS
分类号 G11C17/00;G11C16/34;G11C29/50;(IPC1-7):G11C29/00 主分类号 G11C17/00
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