发明名称 MANUFACTURING METHOD OF METAL COATED PART AND CONTACT STRUCTURE IN INTEGRATED CIRCUIT HAVING ETCH STOP LAYER
摘要 PROBLEM TO BE SOLVED: To provide a method for effectively manufacturing a semiconductor interconnection of an integrated circuit having an etch stop layer. SOLUTION: A trench dielectric layer 4 of a composite structure having a semiconductor substrate, a gate structure, a dielectric spacer adjacent to it, a contact dielectric layer 1 on the layers, an etch stop layer 14 on the contact dielectric layer 1, and a trench dielectric layer 4 on the etch stop layer 14 is etched under the etching conditions not to practically etch the etch stop layer 14, and a trench is formed. An opening is formed in the etch stop layer 14 and the contact dielectric layer 1 by etching, and a conductive material 11 is attached in the opening and the trench.
申请公布号 JP2002016140(A) 申请公布日期 2002.01.18
申请号 JP20010181510 申请日期 2001.06.15
申请人 CYPRESS SEMICONDUCTOR CORP 发明人 BLOSSE ALAIN;THEDKI SANJAY;QIAO JIANMIN;GILBOA YITZHAK
分类号 H01L21/28;H01L21/302;H01L21/3065;H01L21/311;H01L21/3205;H01L21/60;H01L21/768;H01L23/485;(IPC1-7):H01L21/768;H01L21/306;H01L21/320 主分类号 H01L21/28
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