发明名称 OPTOELECTRONIC DEVICE, INSPECTION METHOD THEREOF, AND ELECTRONIC EQUIPMENT
摘要 PROBLEM TO BE SOLVED: To realize accurate inspection even when lines of wiring formed in a projected area have narrow spacing between each other. SOLUTION: An optoelectronic device is provided with a substrate for holding an optoelectronic substance, and a plurality of wirings having a routed wiring part formed in an area except the area facing the optoelectronic substance on the substrate. The routed wiring part of each wiring has a 1st part, and a 2nd part narrower than the 1st part in width. In the inspection process of a liquid crystal device having such a constitution, a plurality of inspection terminals for supplying a prescribed drive signal to each wiring is brought into contact with the 2nd part of each wiring.
申请公布号 JP2002202731(A) 申请公布日期 2002.07.19
申请号 JP20010253468 申请日期 2001.08.23
申请人 SEIKO EPSON CORP 发明人 UEHARA HIDEKI
分类号 G01R31/00;G02F1/13;G02F1/1335;G02F1/1339;G02F1/1345;G09F9/00;G09F9/30;G09F9/35 主分类号 G01R31/00
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