发明名称 FLAW DETECTION METHOD IN EXISTING APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To provide a flaw detection method where a flaw in a conventional existing installed apparatus can be detected at a site and nondestructively, the flaw can be detected and analyzed at the site and the generation position of a crack or the like can be specified, when the existing apparatus is situated in a position in which the flaw cannot be detected easily, such as, e.g. a pipe is hard to pull out. SOLUTION: The transmitted X-rays of a part to be inspected are enlarged and image-formed on a high-sensitivity imaging plate by using X-rays whose focus size is severalμms at the existing site, and the imaging plate is laser- scanned so as to be changed into a sharp digital image, so that an analytical image which can be visually recognized easily at the site can be obtained.</p>
申请公布号 JP2002243666(A) 申请公布日期 2002.08.28
申请号 JP20010036385 申请日期 2001.02.14
申请人 SUMITOMO PRECISION PROD CO LTD;NON-DESTRUCTIVE INSPECTION CO LTD 发明人 SHOTANI HITONOBU;HIRAKI MINORU;ETO YOSHIMARU
分类号 G01N23/04;G01T1/00;G01T1/29;G21C17/003;G21K4/00;(IPC1-7):G01N23/04 主分类号 G01N23/04
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