发明名称 PLASMA PROCESSING APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a plasma processing apparatus that is enhanced in yield.SOLUTION: A plasma processing apparatus contains a processing chamber which is disposed in a vacuum container and can be reduced in pressure, and a sample table disposed in the processing chamber, a substrate as a processing target being mounted on the upper surface of the sample table. The plasma processing apparatus processes the substrate by using plasma formed in the pressure-reduced processing chamber. The sample table has: an upper member for electrostatically adsorbing and holding the substrate mounted on the upper surface thereof; a lower member which is disposed below the upper member with a gap between the lower member and the upper member, and in which a flow passage for making refrigerant flow is disposed; an electrode which is disposed between the upper member and the lower member and forms electrostatic force for adsorbing the upper and lower members; and a gas introduction passage for introducing gas for heat transfer into the gap between the adsorbed upper and lower members.SELECTED DRAWING: Figure 1
申请公布号 JP2016136552(A) 申请公布日期 2016.07.28
申请号 JP20150010808 申请日期 2015.01.23
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 ICHINO TAKAMASA;OMOTO YUTAKA;YOKOGAWA KENETSU;TANDO TAKUMI
分类号 H01L21/3065;H01L21/683 主分类号 H01L21/3065
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